http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102018210429-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_53c911e75ea09dd4c2705db5306dae77 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B2034-108 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2211-408 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T11-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B6-505 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T11-006 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B6-5205 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B6-5235 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B6-032 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B6-12 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B34-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B6-4241 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B6-4208 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T11-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B6-03 |
| filingDate | 2018-06-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2d3ce998d1270532f6c374ca102864de http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b351454e2ca9c670d0b029a61a073945 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4f73dbcc416beb53ef671d6f7e62fd55 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_959be70f25d5706b92d99bd6cca9a50c http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0785153e688af4a7acca0de182d2953a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3d0fd2a4c96c5aad609497eef063c213 |
| publicationDate | 2020-01-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | DE-102018210429-A1 |
| titleOfInvention | Method for displaying an examination area with a fine structure |
| abstract | The invention relates to a method for representing an examination area for planning and / or checking an implant with a fine structure of an examination object that is adjacent due to a high contrast structure, the high contrast structure comprising bones and / or the implant. The process has the following steps: Recording projection measurement data with a computer tomography system having a counting energy-selective x-ray detector with a number of energy threshold values which can be set by means of an energy threshold set, the first projection measurement data being subdivided into a plurality of spectral projection measurement data which are each assigned to different x-ray energy ranges, first reconstruction of a first image data set based on a weighted combination of the plurality of spectral projection measurement data, the first image data set containing spectral information, Determining at least position information and / or contour information of the high contrast structure on the basis of the first image data set, second reconstruction of a second image data set based on the projection measurement data, at least the position information and / or the contour information of the high-contrast structure being included as parameters in the reconstruction, and the second image data set being reconstructed with a higher image location resolution than the first image data set, - Representation of the examination area with the fine structure based on the second image data set. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102020216306-A1 |
| priorityDate | 2018-06-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID91501 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419546359 |
Total number of triples: 31.