Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_36f8253f3d0d59bcd9259217d4385d10 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2862 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2898 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2875 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2851 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
filingDate |
2017-12-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e6e1dbd983d75ca68718d8f669d08322 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c25c7958bf715f1a0d2177727869c14b http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_05dd611daef5077b303e1a5f3f7b2ada http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_169f181ad3ac752e36427e668cd9dc9c http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9550d594179252b924fe5c081d21d836 |
publicationDate |
2018-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
DE-102017131335-A1 |
titleOfInvention |
Testing an Integrated Circuit Device in an inert gas |
abstract |
A system (100) includes an inert gas supply (118), a heating chamber (102), a test chamber (106), a transfer zone (104), and a heater (112). The heating chamber (102) heats an integrated circuit (IC) device in the inert gas prior to testing. The test chamber (106) includes contact pins for testing the IC device (120) in the inert gas by contacting the contact pins with leads of the IC device (120). The transfer zone (104) is for transferring the IC device (120) from the heating chamber (102) to the test chamber (106). The heater (112) heats the inert gas supplied to the heating chamber (102) and the test chamber (106). |
priorityDate |
2016-12-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |