| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b84717b42a6c267316d5e2f35e6ff122 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-015 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-46
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-48
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-14
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01M13-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-11
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01H1-00 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01M7-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N29-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N29-14
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N29-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N29-44
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01H1-00 |
| filingDate |
2017-10-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_76233d512bc052193e8e3694b86e2c77
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_da08f552ba674c5d6387d93fcc697a4a |
| publicationDate |
2018-04-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
DE-102017124135-A1 |
| titleOfInvention |
Machine error prediction based on analysis of periodic information in a signal |
| abstract |
A "signal periodicity parameter" (PSP) indicates periodic patterns in an autocorrelated oscillation waveform and possible errors in a monitored machine. The PSP is calculated based on statistical measures derived from an autocorrelation waveform and associated vibrational waveform characteristics. The PSP provides an indication of the periodicity and a generalization of the possible error, while the properties of the associated waveform indicate the severity. A "Periodic Information Chart" (PIP) is derived from an oscillatory signal that is processed using two analysis techniques to generate two XY graphs of the signal data sharing a common X-axis. The PIP is generated by correlating the Y values on the two graphs based on the corresponding X value. The amplitudes of the Y values in the PIP are derived from the two source graphs by multiplication, ratioing, averaging, or maintaining the maximum value. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102021126372-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102021214964-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111581762-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111581762-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102019127085-B4
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102019127524-A1 |
| priorityDate |
2016-10-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |