| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_db77e52d4e9c9718b5feb3e8e8a8ea28 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0408
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0466 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate |
2017-09-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b48f30d8d1c877fd182f45810bc55bb9
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ed3e475536499ef40823811b05f62f74
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f5e87ffcc883c6783d22458776e94475
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7ac35614ce78d782fd644c1db1d3c8d1 |
| publicationDate |
2018-03-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
DE-102017120837-A1 |
| titleOfInvention |
Socket for testing electronic components and test site facility |
| abstract |
A pedestal for testing electronic components comprising: a plurality of force-measuring pairs, each force-measuring pair having a force contact spring and a measuring force spring, wherein the force contact spring and the measuring contact spring are adjacent to each other, and wherein at least one of the force Contact spring and the measuring contact spring is coated with an electrically insulating coating, where the force contact spring and the measuring contact spring abut each other. |
| priorityDate |
2016-09-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |