| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0952a993ee98c37a5569427f57b85836 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B5-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N25-16
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B5-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N25-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B21-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B11-24
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B21-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B11-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B21-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N3-02 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B5-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B21-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B21-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B11-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N25-16 |
| filingDate |
2015-12-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_972a1088a28f64781b5eb243a4cd248e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8caf6c0d95017984d3f81a0fb48befb0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_07d5004ed5275223fb9a5e930c86358a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1d07212744dd50bad58851350f0b910e |
| publicationDate |
2017-06-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
DE-102015225503-A1 |
| titleOfInvention |
Method for determining a surface profile change of a filling compound in a recess |
| abstract |
The present invention provides a method of determining a surface profile change of a fill mass in a recess, comprising determining a first surface profile of a surface of the fill mass across the recess at an exit temperature; Cooling or heating the recess with the filling compound to a predetermined measuring temperature; Determining a second surface profile of the surface of the filler over the recess at the measurement temperature; and comparing the second surface profile with the first surface profile to determine the surface profile change. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114858120-A |
| priorityDate |
2015-12-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |