| abstract |
The present invention relates to a device for the optical characterization of a sample and / or the material (s) thereof with a lighting unit, which is designed to illuminate a sample space section into which the sample can be introduced, with incident light or can be aligned the sample chamber section introduced sample by receiving aligned by the sample reflected light or alignable detection unit, which is designed to detect at least two different, preferably two orthogonal, polarization components in the reflected light, and an evaluation, with which imaged in the imaging data recorded by the detection unit Surface elements (reflection elements) of the sample are identifiable, the reflected reflected light is based on a reflection of the incident light on the sample, and with the detected different polarization Santeile for these reflection elements to the optical characterization are evaluable. |