http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102006009321-A1

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filingDate 2006-03-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b11e86a1ad3b3afe4b6ad65429d97a70
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publicationDate 2007-09-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber DE-102006009321-A1
titleOfInvention Device for final measurement
abstract In a test device with which a large number of isolated semiconductor components (13) are subjected to a functional check, the contact pins (22) integrated in a test socket (21), which establish mechanical and electrical contact between the test socket (21) and the integrated semiconductor circuits (13 ) produce a recording device (DUT board) connected to the test socket (21) for the transmission of electrical signals from and to a program-controlled electronic circuit system and line and control devices (17, 26) for operating at least one pneumatic transport and holding device for recording, Alignment and positioning of the isolated semiconductor components (13) includes, an inert gas is provided as a medium for operating the pneumatic devices.
priorityDate 2006-03-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 19.