| abstract |
Test arrangement for molecular components, In which a first or lower contact device (14) is formed with a surface region (14a), In which a second or upper contact device (18) is formed with a surface region (18a), In which a test material region (16) is formed as an arrangement (16 ') of a plurality of molecules (16-1) between the first contact device (14) and the second contact device (18), In which the first and the second contact device (14, 18) are in the form of first and second electrodes in direct electrical contact with the test material region (16), - In which an upper probe device (30) in a Abgreifbereich (18A) of the second contact device (18) mechanically placed and thereby mechanically and electrically contacted with the second contact device (18), In which an electrically insulating buffer material region (40) is formed on the surface region (14a) of the first contact device (14) with at least one recess (42), - at which the ... |