http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-10126575-C1

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d49de4efacc50371121175d075552f39
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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-32136
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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3213
filingDate 2001-05-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2002-10-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_777c30364c28295ae5ead314c14ff335
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d70267776a8c874cdf4420d7ff69bcb9
publicationDate 2002-10-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber DE-10126575-C1
titleOfInvention Plasma etching process for MoSiN layers on halftone phase masks based on gas mixtures containing monofluoromethane and oxygen
abstract The invention relates to a method for etching phase shift layers of halftone phase masks. The phase shifter layer is etched with increased plasma cathode power, which is obtained from CH¶3¶F and O¶2¶. The method shows a very high selectivity between the substrate and the phase shift layer, so that halftone phase masks can be produced with a high imaging quality.
priorityDate 2001-05-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 30.