http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-10117167-B4
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_46570326040ec3afb9917a7e7799019f |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-0016 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B7-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-00 |
| filingDate | 2001-04-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2004-06-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9e61e45e386b16a761092cf69445752b |
| publicationDate | 2004-06-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | DE-10117167-B4 |
| titleOfInvention | Inspection microscope and lens for an inspection microscope |
| abstract | Inspection microscope (1) with a light source (3) which emits light of a first wavelength below 400 nm for illuminating an object (13) to be inspected, an objective (11) which is composed of several optical components and a numerical aperture and a Has focal length, a tube optics (21) and an autofocus device (25) which directs light of a second wavelength onto the object (13), characterized in that the second wavelength is greater than 400 nm and the lens (11) has an optical correction that eliminates the longitudinal chromatic aberration with respect to the first and the second wavelength and that the optical components are assembled without cement and that the numerical aperture is greater than 0.5. |
| priorityDate | 2001-04-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 28.