http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-10061106-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a2bcaf91101a370a3d64e3190366357f |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2648 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R27-2652 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R27-04 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R27-2641 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-265 |
| classificationIPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R27-04 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-265 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R27-26 |
| filingDate | 2000-12-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5223a92bbc69af85a855feaebf0d577b http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e893d3aac865597d5602bdbfe3ae55fd |
| publicationDate | 2002-06-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | DE-10061106-A1 |
| titleOfInvention | Method and device for checking electrical material properties |
| abstract | A device with a measuring arrangement (1) is used to check the electrical material properties of high-resistance, preferably semi-insulating materials, in particular wafers made of compound semiconductor material as the test object (7), the test object being used as a lossy dielectric in the field area of a capacitive probe (2) and electrical parameters (K) can be determined without contact. DOLLAR A The specific electrical resistance can be derived from these. After determining the electrical parameters (K¶O¶), at least one further determination of electrical parameters (K¶B¶) is carried out under the simultaneous action of a magnetic field of known size on the test object. DOLLAR A Then the charge carrier mobility (mu) is determined from the electrical parameters (K¶O¶; K¶B¶) and the magnetic flux density (B) of the magnetic field. |
| priorityDate | 2000-12-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 23.