http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-10055431-A1

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filingDate 2000-11-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5f3afefe3824ab19112aad1788bb2314
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8c4454b1d135ae27c70c88f96c9ae16f
publicationDate 2001-05-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber DE-10055431-A1
titleOfInvention Method for manufacturing capacitors of a semiconductor component
abstract The invention relates to a method for producing capacitors of a semiconductor component. This method comprises a method for producing a capacitor of a semiconductor component, with the following steps: a lower electrode is formed on a semiconductor substrate which is formed with various structures which are required for producing a semiconductor component; an amorphous TaON thin layer is deposited over or on the lower electrode; and the deposited amorphous TaON thin film is subjected to a thermal process step at a low temperature and a thermal process step at a high temperature, so as to form a dielectric TaON layer; and an upper electrode is formed on the dielectric TaON layer. Because the TaON thin film is used as the dielectric layer, better electrical properties can be achieved and at the same time a capacity required for the semiconductor component can be ensured.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-10064068-B4
priorityDate 1999-11-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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