http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DD-293891-A5
Outgoing Links
Predicate | Object |
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assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_aabd90eda02b27e324683ae7a09d73ac |
classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0426 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-8427 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-1708 |
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-2418 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-1702 |
classificationIPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-84 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-17 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N29-24 |
filingDate | 1990-04-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a8b4f74733976674c7319814caf80708 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bfd58f4df2cbe9b549b7cd042de81398 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_275010ef3b97b6f05d042a1c1e175d8f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ebdd4baa2d4d46231c8eba10dee68102 |
publicationDate | 1991-09-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | DD-293891-A5 |
titleOfInvention | ARRANGEMENT FOR DETERMINING THE ABSORPTION AND LASER STRENGTH OF OPTICAL LAYERS |
abstract | The invention relates to an arrangement for determining the absorption and the laser resistance of optical layers, preferably the electrical layers. It can be used for testing of special optical layers and layer systems z. B. anti-reflection and mirror coating systems, layer polarizers and interference filters. The arrangement according to the invention comprises an oscillating quartz sensor element consisting of crystalline quartz and metal layer electrodes and a layer to be tested arranged in a specific manner thereon. Upon irradiation of the at least partially transparent arrangement with intense laser light, the induced thereby thermal and / or mechanical changes of the layers can be detected very accurately with immediate acquisition of digital signals. {Absorption; Laser strength; optical layers; dielectric layers; Quartz crystal sensor element, partially transparent; irradiation; thermal / mechanical changes} |
priorityDate | 1990-04-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Predicate | Subject |
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isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID457707758 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID24261 |
Total number of triples: 22.