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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-306
filingDate 1985-03-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_728efa13f1ee8d742396478448801a01
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publicationDate 1986-04-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber DD-235134-A1
titleOfInvention PROCESS FOR PLASMACHEMICAL APPLICATION
abstract The invention relates to a method for plasma-chemical etching on a silicon nitride or polysilicon layer applied to a semiconductor substrate in the manufacture of microelectronic components. The aim and the object of the invention is to enable the plasma-chemical etching of structures with very small dimensions in a simple and economic manner with high accuracy. According to the invention, the object is achieved by carrying out the plasma-chemical etching at a pressure of 80... 200 m torr with an etching mixture of carbon tetrafluorocarbon and 5 to 30% by volume of nitrogen.
priorityDate 1985-03-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 34.