http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DD-149968-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c3ac029f7e57586cad04a0e21b4fa4c0 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-00 |
| filingDate | 1980-04-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_66007ba97ad2c565f1664f1cdd5c1552 |
| publicationDate | 1981-08-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | DD-149968-A1 |
| titleOfInvention | DEVICE FOR THE AUTOMATIC MEASUREMENT OF GEAR DIFFERENCES TO SEVERAL WAVE LENGTHS ON INTERFERENCE MICROSCOPIC OBJECTS |
| abstract | The invention aims at high repetition frequency, independent of variations in the light output of the light source and transmission variations of the object to allow measurements with working in natural light interferometers. The invention provides a device which automatically and simultaneously performs measurements at two wavelengths, transforms path differences into the time domain, and analyzes the temporal succession of delta = n.lambda repeating states by means of an electronic circuit. For this purpose, light is linearly modulated in a period over several wavelengths lambda, brought to interference after passing through an interferometer, the current average intensity is generated in a second period, the beam path is split into two spectral ranges, the light signals are transformed into electronic signals stored corresponding to the average intensity and compared by means of comparator with those obtained in the 1st period. |
| priorityDate | 1980-04-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID756 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID425769382 |
Total number of triples: 12.