http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-214750673-U
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5112d0b90fb2576498e6ae9731489643 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2021-04-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2021-11-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c3cf0be658d3c76b6029e3daa32591f1 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_54e6f658940f6fae2ac02fbb16c8b77e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6363f9836ba907aa0fbdbd3559766ec1 |
| publicationDate | 2021-11-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-214750673-U |
| titleOfInvention | Low-impurity-sense testing device for silicon carbide double-pulse testing |
| abstract | The application relates to a low-impurity-inductance testing device for silicon carbide double-pulse testing, wherein a capacitance module of the low-impurity-inductance testing device comprises a plurality of charging capacitors connected in parallel, first electrodes of the charging capacitors are connected with the same first bus bar, and second electrodes of the charging capacitors are connected with the same second bus bar; the coaxial resistor module comprises a coaxial resistor and a connecting piece, a first electrode of the coaxial resistor is electrically connected with the first busbar, and a second electrode of the coaxial resistor is electrically connected with the connecting device module; the connecting device module comprises a first connecting bar, a testing device and a second connecting bar, wherein the first connecting bar is electrically connected with a second electrode of the coaxial resistor, and the second connecting bar is electrically connected with a second bus bar; the first busbar and the second busbar are clamped between the first busbar and the second busbar by the first connecting bar and the second connecting bar; the application has the effect of low circuit noise. |
| priorityDate | 2021-04-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID9863 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419549006 |
Total number of triples: 15.