http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-214150794-U
Outgoing Links
Predicate | Object |
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assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5905983a184fac60874d60659f755e7c |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-04 |
filingDate | 2020-11-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate | 2021-09-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_24ad59c373d45272cf03b573d90b00a7 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1c281e862dbaaa5a450b24f12ee47eb4 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1a413bb89f164ed2eb8b4398029c2523 |
publicationDate | 2021-09-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | CN-214150794-U |
titleOfInvention | SMD diode electrical performance test seat |
abstract | The utility model provides a SMD diode electrical property test seat, relate to semiconductor package manufacturing field, the on-line screen storage device comprises a base, the base sets up first installation piece and second installation piece, the second installation piece sets up the breach, the symmetry interval sets up two copper blocks around in the breach, the opposite face of two copper blocks is the step face, the step face includes step face left side section and step face middle section, the interval of the step face left side section of two copper blocks matches with the length of SMA diode, the interval in step face middle section matches with the length of SMB diode, set up two electrically conductive connecting pipes in the second installation piece, the left end of two electrically conductive connecting pipes is connected with two copper blocks respectively, the right-hand member sets up at the second installation piece outsidely, the right-hand member of electrically conductive connecting pipe sets up the slot, first installation piece sets up pressing device. The utility model discloses can solve and carry out the electrical property test to the SMD diode of different grade type and need change electrical property test seat repeatedly and lead to the lower problem of easy test failure of efficiency of software testing. |
priorityDate | 2020-11-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Predicate | Subject |
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isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID418354341 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23978 |
Total number of triples: 16.