http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-214011318-U

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_7c0f6faae632618ebd5fec863ff98ecb
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2020-09-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2021-08-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2e59f1b4499bda774754aa02696318e0
publicationDate 2021-08-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-214011318-U
titleOfInvention Double-end probe for semiconductor performance test
abstract The utility model discloses a double-end probe is used in semiconductor performance test, including the adapter sleeve, the welding has the taper sleeve on one side outer wall of adapter sleeve, and has seted up the thread groove on one side inner wall of adapter sleeve, one side position department welding that is close to the thread groove on one side inner wall of adapter sleeve has the fixed disk, the inside of adapter sleeve is provided with the probe cover, the one end welding of probe cover has the thread head, and the inside sliding connection of probe cover has first slide, the welding has the probe pole on one side outer wall of first slide. This double-end probe is used in semiconductor performance test through mutually supporting of adapter sleeve and probe cover to screw thread at thread head and thread groove closes soon and is connected, can be convenient dismantle the probe rod in the probe cover and take out, be convenient for change the probe rod of wearing and tearing on the one hand, improve the convenience that the probe rod was changed, on the other hand is convenient for fully wash the probe after dismantling, guarantees the inside abluent effect of probe.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-115047316-A
priorityDate 2020-09-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID6318
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419484328

Total number of triples: 15.