http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-213397013-U
Outgoing Links
Predicate | Object |
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assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_27f3121211ffe2d6cf6dfea46269adba |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B21-08 |
filingDate | 2020-10-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate | 2021-06-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_803fc625751e5a44832f17ab4ad0e199 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ee19544e66d08224253bd7038ad8174b http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_43cff2bea16c0095fdd85d91b458c5f3 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bd1c1321022e94cd6c7b5a22e6ba120f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ce4caed4846994743e2a30f1d491539f |
publicationDate | 2021-06-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | CN-213397013-U |
titleOfInvention | Accurate measuring device of mercury cadmium telluride epitaxial film thickness |
abstract | The utility model discloses an accurate measuring device of mercury cadmium telluride epitaxial film thickness in the technical field of measuring equipment, which comprises a device base, wherein the top of the device base is fixedly connected with a hydraulic rod and a control switch, the control switch is positioned on the right side of the hydraulic rod, the top of the hydraulic rod is fixedly connected with an adjusting platform, the top of the adjusting platform is fixedly connected with a fixed seat, the top of the fixed seat is fixedly connected with an adjusting device, the adjusting device comprises a fixed threaded rod, the outer surface of the fixed threaded rod is movably connected with a hand wheel through threads, the outer surface of the fixed threaded rod is movably connected with a movable cylinder above the hand wheel, the bottom of the movable cylinder is movably connected with the top of the hand wheel, the accurate measuring device of the mercury cadmium telluride epitaxial film thickness has simple structure and convenient operation, and ensures the stability of the measuring process, the accuracy of measuring the thickness of the mercury cadmium telluride epitaxial film is improved, and the method has high practicability. |
priorityDate | 2020-10-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Predicate | Subject |
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isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID415794430 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID94407 |
Total number of triples: 17.