http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-212569022-U
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c4c4b020ae47c612ae068302b908cfa7 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2020-07-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2021-02-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0920a80caf1c0634e83be45c81ceee01 |
| publicationDate | 2021-02-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-212569022-U |
| titleOfInvention | Ceramic embedded positioning type test seat for semiconductor device |
| abstract | The utility model relates to a test seat for a ceramic embedded positioning type semiconductor device, which comprises a base; the switching bracket is arranged on the base; a support block, an integrated test piece, a main body and a limiting cover plate are sequentially arranged above the switching support from bottom to top; a ceramic positioning component is embedded in the main body and used for limiting the chip; a chip is arranged in the ceramic positioning component; a through hole for accommodating the chip to pass through is formed in the limiting cover plate; the utility model discloses a pottery embedding locate mode test seat for semiconductor device, the needle point of test piece adopts tungsten steel welding and test piece integral type symmetrical design, the contact of the needle point of test piece and chip pin has been strengthened, the supplementary assurance contact accuracy of four right angle location and ceramic thimble that the chip formed through first spacing ceramic block and the spacing ceramic block of second simultaneously, make it reach the contact and the test effect of ideal, the reliability and the life of contact have been improved, the maintenance change time cost has been saved, the test is stable and the test yield is high, the cost is reduced when having improved production efficiency. |
| priorityDate | 2020-07-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 16.