http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-212008819-U
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b1691ebeef037d05b5f35e952f763a36 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2020-04-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2020-11-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c6430ba069ca6a4b4f6b0932f4bb160d http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1f02c01519d43158dea5f47e2b1812b0 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_133f4382eaff304024a376dec67f9362 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e0def606fa02085810c84f85b4bf4e28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a15c20047c5128b92bb8dbbfb8c9ad06 |
| publicationDate | 2020-11-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-212008819-U |
| titleOfInvention | Testable micro device arrangement structure |
| abstract | The application provides a testable microdevice range structure, including the substrate, be located a plurality of little LED chips that are array and arrange on the substrate, first electrode and second electrode are located the one side that deviates from the substrate on the little LED chip to and with the first electrode of little LED chip and/or second electrode electric connection's extension electrode, the area of extension electrode is great, and the electrode of 2-4 little LED chips of extension electrode electric connection simultaneously. The micro LED chip can use the probe to test the photoelectric performance because the area of the extension electrode is larger; the extension electrode is simultaneously connected with the electrodes of 2-4 micro LED chips, so that the probe moving times can be reduced relative to the probe moving times tested one by one in the testing process, and the testing time can be saved; meanwhile, test errors caused by dead spots in series connection or parallel connection are avoided, and test accuracy is improved. |
| priorityDate | 2020-04-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 20.