http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-211652417-U

Outgoing Links

Predicate Object
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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-64
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N3-60
filingDate 2020-03-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2020-10-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5939594ad1cfa0dd8c2df3e0b404af1f
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publicationDate 2020-10-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-211652417-U
titleOfInvention Cold and hot impact equipment
abstract The utility model discloses a cold and hot impact equipment, include: a base; the control box is fixed on the base and internally provided with a controller; the excitation subassembly is fixed in the side upper portion of control box, and the excitation subassembly further includes: the device comprises an exciter and an exciter fixing seat, wherein the exciter is used for connecting an optical fiber probe for testing the photoelectric characteristics, the exciter is fixedly arranged on the exciter fixing seat, a chip is arranged in the exciter, and a power supply module is arranged in the exciter fixing seat; the cold and hot impact box comprises a box body and a box cover, wherein a semiconductor refrigeration chip, a sample groove and a metal block are arranged in the box body, the upper surface of the material groove block is provided with the sample groove filled with a sample to be tested, the metal block is arranged at the lower part of the material groove block, one part of the semiconductor refrigeration chip is embedded at the lower part of the material groove block, the other part of the semiconductor refrigeration chip is embedded at the upper part of the metal block, and the semiconductor refrigeration chip is electrically connected with the controller; the cold shock device is in the test state with the sample cell below the exciter. The device focuses the warming and testing on the same device.
priorityDate 2020-03-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 23.