http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-211478534-U

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fd4fb38acfc3fdb1000b18c315575bff
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2019-09-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2020-09-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e76a8527ec1ec8dfdc6bd5bfe9255590
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e1ecacc590ad1f957981038679152051
publicationDate 2020-09-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-211478534-U
titleOfInvention Aging hammering testing device of power semiconductor device
abstract The application relates to the technical field of testing of power semiconductors, and discloses an aging hammering testing device of a power semiconductor device. The aging hammer test device of the power semiconductor device in the application comprises: a housing, at least one power source, a plurality of supports, and at least one test assembly: a plurality of support members positioned within the housing and fixedly positioned relative to the housing; at least one power source and at least one test assembly are located on at least one of the plurality of supports; the at least one test assembly comprises a test circuit board, and the power semiconductor device can be inserted on the test circuit board; at least one power source is electrically connected to the test assembly. Through the extension support piece, the aging hammer test device of the power semiconductor device disclosed by the application can simultaneously carry out aging hammer test on hundreds of power semiconductor devices, so that the aging hammer test device can be effectively used as a supplementary test of the related reliability test requirements and certification of the conventional JEDEC.
priorityDate 2019-09-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID9863
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419549006
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541

Total number of triples: 16.