http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-211478534-U
Outgoing Links
Predicate | Object |
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assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fd4fb38acfc3fdb1000b18c315575bff |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
filingDate | 2019-09-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate | 2020-09-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e76a8527ec1ec8dfdc6bd5bfe9255590 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e1ecacc590ad1f957981038679152051 |
publicationDate | 2020-09-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | CN-211478534-U |
titleOfInvention | Aging hammering testing device of power semiconductor device |
abstract | The application relates to the technical field of testing of power semiconductors, and discloses an aging hammering testing device of a power semiconductor device. The aging hammer test device of the power semiconductor device in the application comprises: a housing, at least one power source, a plurality of supports, and at least one test assembly: a plurality of support members positioned within the housing and fixedly positioned relative to the housing; at least one power source and at least one test assembly are located on at least one of the plurality of supports; the at least one test assembly comprises a test circuit board, and the power semiconductor device can be inserted on the test circuit board; at least one power source is electrically connected to the test assembly. Through the extension support piece, the aging hammer test device of the power semiconductor device disclosed by the application can simultaneously carry out aging hammer test on hundreds of power semiconductor devices, so that the aging hammer test device can be effectively used as a supplementary test of the related reliability test requirements and certification of the conventional JEDEC. |
priorityDate | 2019-09-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 16.