| abstract |
The utility model discloses an ultrasonic wave longitudinal wave reflection method jointly detects probe group with diffraction time difference method, this probe group include curved surface TOFD probe and creeping wave probe, and wherein, curved surface TOFD probe includes curved surface wafer (15), the wafer angle of curved surface wafer (15) is 40-45. The creeping wave probe is a TRCr2-Aust double-crystal creeping wave probe. The device makes up the defects of missing detection of defects near the surface and the bottom surface and the defect that a plurality of pairs of probes are needed for thick welding seams when the conventional TOFD probe is adopted for detection, and makes the automatic and semi-automatic detection of ultrasonic waves more perfect. |