http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-209656844-U

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c63034156ee04910020e89f67fa16849
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R19-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2018-11-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2019-11-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_01b21abbc6510430f36e25797ebf464e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8af91a04a78766a5ddb4df683bd7d42f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_65cbefa1e7b2f8deea74c022c5d605be
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_81da0d587b8de7c9928d7ba1de95ae8e
publicationDate 2019-11-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-209656844-U
titleOfInvention A kind of SOT-227 encapsulation metal-oxide-semiconductor cut-in voltage supplemental measurement tool
abstract The utility model discloses a kind of SOT-227 to encapsulate metal-oxide-semiconductor cut-in voltage supplemental measurement tool, including handle, handle end is equipped with lid, lid and handle are integrally formed, cover bottom is equipped with the groove of square, bottom portion of groove is equipped with the first contact in matrix pattern distribution, second contact, third contact and the 4th contact, recess sidewall is equipped with the first threading hole, second threading hole and third threading hole, the first conducting wire connecting with the first contact is equipped in first threading hole, the second conducting wire connecting with the second contact is installed in second threading hole, the privates connecting with third contact is installed in third threading hole.The lid of the utility model is buckled in SOT-227 encapsulation metal-oxide-semiconductor upper surface, and first contact, the second contact, third contact, the 4th contact are respectively aligned to the first spring leaf, second spring piece, third spring leaf, the 4th spring leaf, in conjunction with measuring instrumentss, the quick and precisely measurement of SOT-227 encapsulation metal-oxide-semiconductor cut-in voltage can be realized.
priorityDate 2018-11-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID449159271
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID9883259

Total number of triples: 17.