http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-207752106-U

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_441400d4cfc03e4402398f840c407953
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2018-01-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2018-08-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a3a765cd3c55a0d2066a3b2ba077e84c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_13d0cdcc79c2a18648c783ebc14581be
publicationDate 2018-08-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-207752106-U
titleOfInvention A kind of test adapter for IGBT insulated gate bipolar transistors
abstract The utility model discloses a kind of test adapters for IGBT insulated gate bipolar transistors, including socket and magnet ring, the socket is for three and separate, the spigot inside edge of the test adapter is respectively equipped with two intermediate plates, two intermediate plates of one end spigot are connected by the ends B of wiring and Discrete Semiconductor Testing System, two intermediate plates at medium base sockets are connected by the C-terminal of wiring and Discrete Semiconductor Testing System, and two intermediate plates of other end spigot are connected by the ends E of wiring and Discrete Semiconductor Testing System;Magnet ring is equipped in every wiring, every wiring is passed through from the annular distance of each magnet ring respectively.The utility model provides a kind of test adapter for IGBT pipes, can improve the testing efficiency and measuring accuracy of measured device.
priorityDate 2018-01-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23985
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID482532689

Total number of triples: 14.