http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-207689576-U
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fe8920c8a0d94a72f48384c5dd9305dd |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R27-26 |
| filingDate | 2017-10-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2018-08-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_50ed174c1733ccd1a3f6b6b3d5b1fef3 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_945b25d59cc8ec1b3b8fd50c01fc7156 |
| publicationDate | 2018-08-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-207689576-U |
| titleOfInvention | A kind of test system of mini-pads silicon substrate PIN junction capacitances |
| abstract | The utility model discloses a kind of test systems of mini-pads silicon substrate PIN junction capacitances, including：Tester, probe positioning system, probe pressure regulating system, probe retention bar, microscope and objective table, probe positioning system include X/Y axis motion systems and Z axis kinematic system；Microscope is arranged in the top of objective table, and objective table is connected on a tester by p-wire, and one end of probe retention bar is equipped with probe；The system of the utility model is mainly used for the PIN pipes that test is completed and is screened, and this system is simple in structure, easily operated, cost is relatively low, measuring accuracy is high, solves the problems, such as the junction capacity measuring technology of minimum pad silicon substrate PIN pipes, ensure that the requirement for testing PIN pipes in radio circuit. |
| priorityDate | 2017-10-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 17.