http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-207528869-U
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3ba4d1f220257eaf894c779336bda708 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2017-12-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2018-06-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_10440f6365289c82c593bc7fc6802abd http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e4bb7f0fd7918e78e080a31307c1db36 |
| publicationDate | 2018-06-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-207528869-U |
| titleOfInvention | A kind of semiconductor die testing instrument |
| abstract | The utility model discloses a kind of semiconductor die testing instrument, including pedestal, the upper end side of the pedestal is fixedly connected with main frame, the upper end inner wall of the pedestal is equipped with installation card slot, and it is equipped with support board in installation card slot, the outer wall both sides of the support board are symmetrically fixedly connected with fixed plate, and the one end of fixed plate far from support board is fixedly connected with limited block, the inner wall of the installation card slot is equipped with limiting slot corresponding with limited block, several springs are connected between the fixed plate and the bottom wall for installing card slot, the upper end fitting of the support board is placed with semiconductor chip, the outer wall side of the main frame is equipped with display screen, the lower section of display screen is equipped with control button, and the both sides of display screen are arranged with accommodating groove, test pen is equipped in the accommodating groove.The utility model is simple in structure, easy to operate, can effectively avoid the damage of test chip, reduces the cost of detection, improves the success rate of detection. |
| priorityDate | 2017-12-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419557109 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23954 |
Total number of triples: 14.