http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-207114710-U
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a51bfab800a84c5ea378dcb6ed308037 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2017-08-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2018-03-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_192e8992c4b3956698bfb0149dd10cfb http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0164c18a857ea46937f7f0fae8bd5045 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6b6ed0f505faa3c9ae7cd20f346a6cf0 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_58cc8510100325c87f887f32de7cf7b1 |
| publicationDate | 2018-03-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-207114710-U |
| titleOfInvention | A kind of power semiconductor cold cycling test device |
| abstract | The utility model discloses a kind of power semiconductor cold cycling test device, it is characterized in that, including fixing device, refrigerating plant, heating combined equipment and central controller, the fixing device includes fixed plate, heat-conducting plate and supporting plate successively from top to bottom, fixing device is fixed on heat-conducting plate for that will be aging device, the heat-conducting plate is connected with refrigerating plant and heating combined equipment respectively, the central controller is also connected with refrigerating plant and heater respectively, and central controller is used to control refrigerating plant or heating combined equipment to cool or heat up to heat-conducting plate.Advantageļ¼The utility model is based on refrigeration system and heating mica sheet carries out cold cycling, and simple to operate, flexibility is high, and measurement cost is low.The utility model can solve the problem in terms of existing power semiconductor reliability testing temperature cycles, explore influence of the temperature change to device and measure its Parameters variation. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-109738322-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113467546-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111562478-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111562478-A |
| priorityDate | 2017-08-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 24.