http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-206114437-U
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d6a6f422b091ba12ea61d4adbf1b0e8e http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4c0ed78c4d5c4951a22374d61ea1f178 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N3-18 |
| filingDate | 2016-10-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2017-04-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d6c1b8cd4deec1b16203d2502480bcf1 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0357a597456da54c590701956724828d http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6ff9d521e2859fa47c16f5b58f7c37bc http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b2c06459de23f5dd77eae7ce4316ac98 |
| publicationDate | 2017-04-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-206114437-U |
| titleOfInvention | Scanning electron microscope central plain position high temperature microscopic mechanics testing arrangement |
| abstract | The utility model discloses a scanning electron microscope central plain position high temperature microscopic mechanics testing arrangement, including control system, tensile testing device, heating device and fixing device, the tensile testing device is provided with an accommodation space, and heating device sets up in the accommodation space, and the tensile testing device all is connected with fixing device with heating device's bottom, fixing device's bottom and tensile testing 0's sample support frame tensile testing 1, tensile testing device, heating device and fixing device all set up in scanning electron microscope's cavity, and scanning electron microscope, tensile testing device and heating device all are connected with the control system electricity. The utility model discloses well testing arrangement compact structure can be easy to assemble in the microscope, and setting up of heating device makes the test go on under high temperature load condition, conveniently realizes the scanning beam and observe testing sample normal position formation of image developments under high temperature load and the stress loading, acquires same observation microdomain the composition information register for easy reference and the crystal structure communication chart of sample inside the country simultaneously. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113029765-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-106370527-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-109781761-A |
| priorityDate | 2016-10-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID962 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419512635 |
Total number of triples: 20.