http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-204613355-U
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_609910cdb57b9c375a213262abfb5d52 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2015-04-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2015-09-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_41386c45aa548da1ff3e39123a13dfce http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_32b1a2d118eabc248d10f88a5dfc5e86 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_12c3ba71bee6c39f5f421f133687d859 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f76c531be4ab736a288d80808b0a8844 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0b10543dd7bffc4abcb877b99b49cfe6 |
| publicationDate | 2015-09-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-204613355-U |
| titleOfInvention | A kind of nitrogen oxide sensor chip ageing test device |
| abstract | The utility model discloses a kind of nitrogen oxide sensor chip ageing test device, this device comprises communication module, control module, signal analyse block, aging power supply, sampling resistor and chip fixture; The flexible binding post of chip fixture, aging voltage is loaded on the heating electrode of nitrogen oxide sensor chip via elastic connecting terminal; The heating electrode of nitrogen oxide sensor chip has resistance, under the effect of aging voltage, and the heating electrode heating of nitrogen oxide sensor chip; Adjusted the aging voltage of aging power supply output by control module in real time, realize the object to nitrogen oxide sensor chip heating electrode CYCLIC LOADING aging voltage; Gather voltage to obtain the heating current data on chip electrode by sampling resistor simultaneously, to judge whether the heating electrode of nitrogen oxide sensor chip to be measured is blown, thus realize burn-in test, reach the object of superseded defective products; This chip ageing test device that the utility model provides has feature that is simple to operate, that be convenient to Data Collection, monitor and review. |
| priorityDate | 2015-04-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID945 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559537 |
Total number of triples: 17.