http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-202929163-U
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d6a6f422b091ba12ea61d4adbf1b0e8e |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R19-165 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2012-11-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2013-05-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_58b9b211c1508d52bcdf2bca33b28ca8 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_03154f0d07ac5122511fd26e9baa9965 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_678d3c837c14bbf6469c84531311d75f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fe89745cc8cb372a0a6c8981ce530f51 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_49484ccd7d8634ea1cf828a783031d27 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0e5e655ff474ec10bd1454d3263767ac |
| publicationDate | 2013-05-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-202929163-U |
| titleOfInvention | IGBT failure detection circuit |
| abstract | The utility model discloses an IGBT failure detection circuit, comprising an IGBT damage detection circuit, an IGBT over-current detection circuit, an IGBT overvoltage detection circuit and a signal reactive circuit. The three detection circuits all detect the voltage of the IGBT collector electrode - emitter electrode through voltage comparators with a high sensitivity, and the detection values are respectively compared to the reference voltages set by the voltage comparators. Each detection circuit inputs the detection result in a TTL level form to the signal reactive circuit, when the IGBT is damaged, or over-current or overvoltage fault happens, the fiber illuminating head in the signal reactive circuit is triggered, and an obtained fault feedback signal is transmitted by the fiber in an isolation manner and then output by a high speed optical coupler. According to the IGBT failure detection circuit, whether the IGBT is damaged is detected in time, whether over-current phenomenon of the IGBT happens is detected in real time, whether overvoltage phenomenon of the IGBT happens is detected in real time, and when any fault appears, a fault feedback signal is rapidly output. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-105388408-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-105388408-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108957271-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-110474522-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-112104346-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-110474522-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-107994555-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-112104346-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-107994555-B |
| priorityDate | 2012-11-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419523132 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID6326954 |
Total number of triples: 28.