http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-115128422-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d9de52bba13e16028dffa8775e3f3f28
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2022-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5b997edb07e6195420c9ec0f38612769
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f0e2b1e410cfd66401959c9f4eed7c46
publicationDate 2022-09-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-115128422-A
titleOfInvention All-in-one test system and test method for electrical and thermal parameters of power semiconductor devices
abstract The invention provides an all-in-one testing system and testing method for electric and thermal parameters of power semiconductor devices, wherein the testing system includes: a host computer module, a control circuit module, a driving module, a conduction voltage drop monitoring module, a power circuit module, a measurement module, The DC power supply module and temperature control module are used to test the conduction voltage drop, switching loss and thermal impedance and electrothermal characteristic parameters of power semiconductor devices. The present invention can test the electric-thermal characteristic parameters of power semiconductor device switching, conduction and thermal impedance, and integrates the testing circuit and testing method for testing the electric-thermal characteristics of power semiconductor device conduction, switching and thermal impedance into one test system, It enables the user to complete the automatic testing of the three characteristic parameters through one testing system, which greatly improves the testing efficiency and reduces the testing cost.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-116203373-A
priorityDate 2022-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559169
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID9863
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID117559
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419549006

Total number of triples: 17.