http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-115015305-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02P70-50 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-079 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2001-2893 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-44 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-2202 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-2252 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-286 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-44 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-2202 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-2252 |
| filingDate | 2022-08-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2022-10-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2022-10-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-115015305-B |
| titleOfInvention | Doped zinc oxide standard sample and its preparation method and method for measuring the content of doping element in unknown doped zinc oxide sample |
| abstract | The application provides a doped zinc oxide standard sample, a preparation method thereof, and a method for measuring the content of doped elements in an unknown doped zinc oxide sample, and relates to the field of electron probe analysis. The preparation method of the doped zinc oxide standard sample: the raw materials including the zinc source compound and the doped element compound are prepared by the hydrothermal method to obtain the doped-zinc oxide nano-single crystal; Single crystals are pressed into bulk samples, sintered until the single crystal size reaches the micrometer level, and then tempered. The preparation method of the doped zinc oxide standard sample provided by the present application, the prepared standard sample fills the blank of the standard sample doped with a specific element in the standard sample field, and can especially improve the quantitative analysis and test accuracy of the low-content doped sample . Such standard samples are not only suitable for electron probes, but also for other in-situ microbeam analysis methods such as secondary ion mass spectrometry, laser ablation inductively coupled plasma mass spectrometry, and energy spectroscopy. |
| priorityDate | 2022-08-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 37.