http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114894822-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b1b95a0151fe6cf57f119866e3a10c11 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2001-2873 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-286 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-20008 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-20 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-04 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-20008 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-20 |
| filingDate | 2022-06-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_12453b40c00163f248f25bd780dc3f5f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_78d33aeeda96fca5b31e63f4ea915dce http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c6c5408885625c0a4c95212175a06dda http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_82d855fbefafa659659f41a57716934a |
| publicationDate | 2022-08-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-114894822-A |
| titleOfInvention | A kind of preparation method of flexible thermoelectric material transmission electron microscope sample for in situ chip observation |
| abstract | The invention relates to the technical field of in-situ heating and electrification of transmission electron microscopes, and discloses a preparation method of a flexible thermoelectric material transmission electron microscope sample used for in-situ chip observation, comprising the following steps: (1) in-situ chip perforation; (2) (3) Trimming; (4) Preparation before slicing; (5) Ultra-thin slicing; (6) Slicing sample transfer. By combining an optical microscope with a long-stemmed liner, the probability of the flakes falling on the target window is greatly improved. The invention reduces mechanical polishing and resin embedding treatment, avoids thermal and electrical damage, significantly improves the transfer success rate, shortens the sample preparation time to within two hours, and reduces the preparation cost. The non-destructive flakes placed on the in situ chip can apply multiple external fields such as heat and electricity in a transmission electron microscope to perform dynamic observation of structural evolution. |
| priorityDate | 2022-06-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419512635 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID962 |
Total number of triples: 25.