http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114814503-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_cfe973eddc48fee3ef141402d2b4e1d8 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2021-01-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b3e1dda5e69816e1bb7cc57148db5b90 |
| publicationDate | 2022-07-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-114814503-A |
| titleOfInvention | Real-time analysis of semiconductor testing machine test results |
| abstract | The invention provides a method for analyzing test data of a semiconductor testing machine in real time, comprising: a real-time data reading step and a real-time analysis step, and the real-time data reading step reads a test file at a fixed frequency. The real-time analysis step disassembles and merges the read data according to the rules, and obtains a single complete data for analysis. The method for analyzing the test data of a semiconductor testing machine in real time of the present invention analyzes the test files in real time, so as to help find the abnormality in the test process in time and quickly, and minimize the production loss. |
| priorityDate | 2021-01-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419535645 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID43672 |
Total number of triples: 13.