http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114782387-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_935f1af7a979a84911a653ffaccfbfe2
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20032
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20084
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20081
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30164
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T5-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T5-002
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-001
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N3-084
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N3-045
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N3-048
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F18-243
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06V10-764
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06N3-08
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T5-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06N3-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06V10-82
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06V10-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T5-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06K9-62
filingDate 2022-04-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5a13f4d07cd338c2e398ea1d1cb95342
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b4f02d0ec46d500a8b068130babd813a
publicationDate 2022-07-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-114782387-A
titleOfInvention A surface defect detection system
abstract The invention discloses a surface defect detection system, comprising an image acquisition module and a U-Net model; the image acquisition module is used to acquire an image of a workpiece, preprocess the image, extract the original image data of the workpiece, and convert the original image of the workpiece The data is filtered, and the filtered image data is input into the U-Net model. The U-Net model includes an encoder. The U-Net model compresses the image and captures key features, and the encoded image is sampled back by the encoder. Original size, and obtain key information to optimize the custom loss function, and output a binary mask with the same size as the original image; perform binary classification through convolutional network, and output U‑Net model to process data; According to U‑Net model The processed data is compared with the original image data of the workpiece to judge the defect information of the workpiece.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-116523906-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-116523906-B
priorityDate 2022-04-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID450282151
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID73971

Total number of triples: 34.