http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114778604-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e377939dafe37f3384a368be9acf219b |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K71-70 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K30-10 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L51-42 |
| filingDate | 2022-04-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b1981749ec62b11a4834e4e1fabe83f4 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9caf018b63325ccf02bf7ae395cdd334 |
| publicationDate | 2022-07-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-114778604-A |
| titleOfInvention | Method and device for measuring ion concentration in organic-inorganic perovskite |
| abstract | The present application provides a method and device for measuring ion concentration in organic-inorganic perovskite, which are used to detect a device to be tested. The test current within a preset time period after the voltage is removed and started, because the ions in the perovskite layer to be tested migrate under the action of the electric field generated by the voltage to be tested, and accumulate at the interface of the perovskite layer to be tested. After the test voltage is cancelled, the integral operation of the test current within a preset time period can be used to obtain the ionic interface charge in the perovskite layer to be tested. According to the ratio of the ionic interface charge to the test voltage, the perovskite layer to be tested can be obtained. The ionic interfacial capacitance in , and the relationship between ionic interfacial capacitance and interfacial ion concentration obtained by using the dispersed electric double layer model, determine the interfacial ion concentration in the perovskite layer to be tested, and better characterize the perovskite material. electrical properties. |
| priorityDate | 2022-04-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 19.