http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114755434-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_f6c8227bb4adb362b33513a2fa8404ea |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N35-00584 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N35-00603 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N35-0092 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N35-00 |
| filingDate | 2022-06-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_39023f355a47c6da0b0fdbafa49f2802 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3a3762b501a4747399afaea26a14063b http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_743d518f7aa789f293535ef7dbb85a7e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7080dfb66cd4d66542272d1c9cdad64b http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c4929d624d474530217820d4df1dc330 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f1c10167d9b1fb4805ccfc8707283e6e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b799a04996f0dd4358e09fe534e2c597 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_aea97a397b2c42d7e5a4fa9c123072c6 |
| publicationDate | 2022-07-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-114755434-A |
| titleOfInvention | Sample analysis system and sample detection control method, device, controller and medium |
| abstract | The present application provides a sample analysis system and a sample detection control method, device, controller and medium. All samples to be tested are transported along the same conveying direction to the corresponding sampling positions of the sample analyzer for sampling and initial inspection, and then each The re-examination samples that need to be re-examined in the samples to be tested are sequentially transported to the sample analyzer along the same conveying direction for sampling and re-examination. According to the sample detection control method provided in the present application, when there are multiple re-inspection samples that need to be re-inspected, the feeding track of the sample analysis system is always transported along the same conveying direction during the sample analyzer performing the re-inspection task, without the need for round-tripping. Multiple movements are not easy to cause the accumulation of deviations in the movement position of the feed track, so it is not easy to cause the problem of inaccurate movement positions of the feed track. |
| priorityDate | 2022-06-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 103.