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filingDate 2022-01-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ba1d90dcfa14e3f04ee504044368cf73
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publicationDate 2022-05-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-114563432-A
titleOfInvention A Frozen Sample Processing Method for Scanning Electron Microscope 3D Structure Reconstruction Experiments
abstract The invention relates to the technical field related to experimental sample processing, and discloses a frozen sample processing method for a scanning electron microscope three-dimensional structure reconstruction experiment, comprising the following steps: S1: sampling, discharging the air in the sample, filling with a cryoprotectant The sample is frozen and fixed; S2: The sample obtained in the step S1 is placed in a freezing replacement solution to perform a freezing replacement procedure; S3: The sample obtained in the step S2 is rinsed and rehydrated S4: Use aldehydes to replace the sample The sample obtained in the step S3 is rinsed and fixed, so that the ultrastructural information in the biological sample that is close to the natural state can be preserved. Large-scale samples can be prepared for SEM 3D structural reconstruction experiments. The prepared samples have high contrast in the backscattered electron images of the SEM, and the biofilm structure of the samples is clearly visible. The prepared samples can be used in conjunction with the TEM imaging system without the need for heavy metal staining after sectioning.
priorityDate 2022-01-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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