| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_df225ba4cd6250c0e29b874800e4b419 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02P90-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20224
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20221
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30121
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20056 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T5-006
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T5-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T5-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T5-007
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-62
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-73
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-001
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-13 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-13
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T5-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T5-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-62
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T5-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-73 |
| filingDate |
2022-02-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate |
2022-05-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
CN-114519743-A |
| titleOfInvention |
A method, device, equipment and storage medium for extracting defective area of panel |
| abstract |
The present application discloses a method, device, equipment and storage medium for extracting a panel defect area. By acquiring an image of a panel to be tested containing defects; extracting a detection area of the panel image to be tested; and performing edge detection on the detection area to obtain The contour feature in the image of the panel to be tested; the contour feature of the panel image to be tested is subjected to a subtraction operation with a standard template to obtain a defect contour; wherein, the standard template is based on the contour features of the detection area of several non-defective panel images Obtain by fusion; process the defect contour to obtain a mask image of the defect contour. That is, the method of generating a standard template by fusing several defect-free panel images improves the accuracy of the comparison template, thereby improving the accuracy of labeling and extracting defect areas. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-115063421-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-115063421-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-115578377-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-115861293-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-115661157-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-115661157-A |
| priorityDate |
2022-02-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |