http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114487746-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_7bb9b343c94ab6e3d9509bbba07a930e |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2022-01-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_15b699e9213799110738c7c2dda9feda http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d23723afc0785d8ac176d0844f397842 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_14e8ca418bfb390aba68261bd8b0ebae http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b8878b7decb38a2dde3d7f0fe096d23e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c033dd9016db3f5fcfcabdc963f4c2aa http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_94c82db7260ab43fcabc600808f7474a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_98413757b44427ec13da048fd64396ea |
| publicationDate | 2022-05-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-114487746-A |
| titleOfInvention | DC Test System for Compound Semiconductor Devices Based on EMMI |
| abstract | The invention discloses a direct current test system for compound semiconductor devices based on EMMI, comprising a test fixture, a source direct current power supply, a gate direct current power supply, a drain direct current power supply and an EMMI platform; the compound semiconductor device is assembled in the test fixture, and the EMMI platform collects compound semiconductors The background noise signal of the device when the device is not powered on; then the source, gate and drain DC power supplies are used to make the compound semiconductor device in different working states through the test fixture, and the EMMI platform collects the optical signal of the compound semiconductor device and deducts the background. Noise signal, generate the EMMI analysis diagram of compound semiconductor device under working condition, and analyze whether the compound semiconductor device fails, and locate the failure part of the failed compound semiconductor device according to the EMMI analysis diagram. The invention innovatively combines the DC working state of the device with the electroluminescence principle to realize the test of the compound semiconductor device. |
| priorityDate | 2022-01-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 27.