http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114455536-A

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filingDate 2022-02-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b7f81ce8979cf9b8edc17b7e38465f5a
publicationDate 2022-05-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-114455536-A
titleOfInvention Wafer-level three-dimensional packaging method and structure of MEMS gas sensor
abstract The invention provides a wafer-level three-dimensional packaging method and structure of a MEMS gas sensor. The method includes the steps of: providing a semiconductor substrate with an ASIC chip and a plurality of spaced through silicon vias formed therein; thinning the backside of the semiconductor substrate; and etching the backside of the semiconductor substrate to make the surface of the through silicon via protrude from the semiconductor The backside of the substrate; an insulating layer is formed on the backside of the semiconductor substrate; chemical mechanical polishing is performed on the backside of the semiconductor substrate to expose through silicon vias; photolithography and dry etching are performed to form a cavity on the backside of the semiconductor substrate; a MEMS will be formed The MEMS micro-heating plate of the device and the pre-bonded structure are eutectic bonded, the MEMS device is facing the cavity, the through-silicon via and the pad bonding of the MEMS micro-heating plate, the insulating layer and the insulating surface of the MEMS micro-heating plate are bonded ; Form TSV solder balls on the surface of the TSV on the front side of the ASIC chip; and cut to form a single MEMS gas sensor chip. The present invention helps to improve bonding performance and manufacturing process efficiency.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-115692312-A
priorityDate 2022-02-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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