http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114268318-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0b38f158772a34e9040ee0338daa165e |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03M1-10 |
| filingDate | 2021-02-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e869eabee0ac0ddb68ce6a1b8377313e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9f93641a6054d93c902ba5bc2d891e55 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e57c10d645ba017da29f33aafe78c61a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a5fc7c58175d3a1e73cc0f41350e29d0 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e6f32786ddf8d4aa062700c8cb9e79b5 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8fda81312fefa75d1c188310bbfaed5e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b92c8a683f3928c862ad7c1d39b8e04f |
| publicationDate | 2022-04-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-114268318-A |
| titleOfInvention | Calibration method and device for analog-to-digital converter of production-line without acquisition and protection |
| abstract | The application provides a calibration method and a device of an analog-to-digital converter of a non-acquisition and non-protection assembly line, wherein the method comprises the steps of obtaining an increasing interval mean value and a decreasing interval mean value corresponding to a current sampling point after calculating a residual error of the current sampling point; calculating the average value of the ascending interval and the average value of the descending interval to obtain the average value deviation; judging whether the mean deviation is within a preset deviation range; if the mean deviation is not in the deviation range, adjusting the sampling delay of the analog-to-digital converter of the non-acquisition and non-protection assembly line according to the mean deviation; and then repeating the process for the next sampling point until the mean deviation is within the deviation range so as to finish the calibration of the analog-to-digital converter of the non-acquisition and non-protection assembly line. The invention carries out calibration by the mean value of the residual error in the corresponding interval, the mean value of the residual error can avoid the interference of factors such as larger discrete value, PVT change, operational amplifier establishing process, static error and the like, and the size of the aperture error can be represented more accurately, therefore, the scheme can calibrate the analog-to-digital converter more accurately and eliminate the maladjustment of the dynamic comparator. |
| priorityDate | 2021-02-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID7050 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419568092 |
Total number of triples: 18.