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filingDate 2021-12-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_762ec55e7e0c15a8046513777d572411
publicationDate 2022-03-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-114220745-A
titleOfInvention Back-to-face wafer-level hybrid bonding three-dimensional stacking method
abstract The invention relates to a back-to-face wafer-level hybrid bonding three-dimensional stacking method, which comprises the following steps: providing a first wafer; the first wafer comprises a through silicon via positioned in the first wafer, a first interconnecting line positioned on the front surface of the first wafer, a first bonding pad positioned on the first interconnecting line, and a first passivation protective layer wrapping the first interconnecting line and the first bonding pad; thinning the back surface of the first wafer to expose the through silicon via; manufacturing a second interconnection line, a second bonding pad and a second passivation protective layer on the back of the first wafer; carrying out chemical mechanical polishing on the front surface of the second wafer to expose a third bonding pad; and carrying out hybrid bonding on the back surface of the first wafer and the front surface of the second wafer.
priorityDate 2021-12-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 27.