http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114166588-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ef9dfc2fd00887cc7dc608913ce18e41 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2203-0298 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-28 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-04 |
| filingDate | 2021-10-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_91e782051a20f0926ed8607bdee0ed32 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_67a120d3ebe7d36245fe2ff9253bd999 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8b4593ef2386c9f6bb836e46f83463db http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5054716960a8ef511b578d1a9f3c20e2 |
| publicationDate | 2022-03-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-114166588-A |
| titleOfInvention | Sample preparation method for in-situ tensile experiment of transmission electron microscope |
| abstract | The invention relates to the technical field of in-situ nano mechanical testing, and discloses a sample preparation method for a transmission electron microscope in-situ tensile experiment, which comprises the following steps: s1: setting the size of the in-situ tensile sample; s2: putting a sample raw material and a semi-distribution net into a focusing ion beam system; s3: etching two mutually parallel rectangular grooves on a raw material by utilizing an ion beam to form a rough blank between the two rectangular grooves; s4: utilizing ion beams to carry out shape finishing on the rough blank; s5: cutting the rough blank and the raw material to obtain a semi-finished product, and transferring the semi-finished product to the surface of a semi-separation net; s6: the semifinished product is shape-trimmed using an ion beam. By adjusting the step of shape trimming and the beam angle and the size of the ion beam during trimming, the prepared sample has no gradient phenomenon in the thickness direction, and the profile of the sample keeps a smooth linear shape; the method can be used for sample preparation of superhard materials such as diamond and the like which are difficult to process. Samples with large length-diameter ratio can be prepared. |
| priorityDate | 2021-10-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID425762086 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23964 |
Total number of triples: 19.