http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113889174-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c3a2f00e72ba6e4c09b6da573427fbed
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-46
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-48
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-44
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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-26
filingDate 2021-06-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_97edc8024ce3f9f7bb3dfc6bda30fc0c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_52279f91ab9b124e3843524c9b293ba7
publicationDate 2022-01-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-113889174-A
titleOfInvention Memory device testing and associated methods, devices, and systems
abstract The present invention discloses memory device testing and associated methods, devices and systems. A method may include reading from a plurality of memory addresses of a memory array of the memory device and identifying each memory address of the plurality of addresses as a pass or fail. The method may further include, for each identified failure, storing data associated with the identified failure in a buffer of the memory device. Additionally, the method may include transferring at least some of the data associated with each identified fail to a tester external to the memory device without transferring address data associated with each identified pass to the tester.
priorityDate 2020-07-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID426135032
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID7156993

Total number of triples: 18.