http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113533435-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F2119-14 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F30-23 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F30-23 |
| filingDate | 2021-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2022-08-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2022-08-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-113533435-B |
| titleOfInvention | A Curved Crack Propagation Monitoring Method Combining Potential Method and Replica Method |
| abstract | The invention discloses a method for monitoring curve crack growth combining a potential method and a replica method. The method comprises the following steps: performing finite element analysis of steady-state current conduction on samples with different crack lengths to obtain a potential formula; connecting the samples on the samples Wire, connect the power supply voltmeter to form a closed-loop circuit, install the sample, and carry out the test; during the crack propagation process, according to the potential formula and real-time voltage change, stop and repeat several times in the middle; judge the crack shape during the crack propagation process according to the fracture shape and the change of crack size, recalculate the potential formula; modify the potential formula calculated in the previous step according to the replica data and the crack length data measured from the fracture; process the crack at any point on the crack front according to the recorded potential data and the modified potential formula. Length change curve, and then calculate the crack growth rate at any point on the crack front. The invention solves the problem of low reliability of the traditional potential method due to external interference factors. |
| priorityDate | 2021-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID702 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419538410 |
Total number of triples: 15.