| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_cc4e13141d402ceb885f368dfa042348 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2001-2873
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2001-364 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-20008
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-20058
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-2055
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-36
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-286 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-2055
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-36
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-20058
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-20008
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-28 |
| filingDate |
2021-05-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a9b0ff18a5b105f2dafaad62f006c1bc
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e853e999fecc2379a2346a8cf8bc27bd
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0978f7788cb0e92bb7997fdd9e713e1c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_046d42d211c4ef3097c0ec77b58cf810
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9736039d9a7b1e513aff759f0522d3ef |
| publicationDate |
2021-09-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
CN-113406120-A |
| titleOfInvention |
A kind of preparation method of metal friction layer transmission electron microscope sample |
| abstract |
The invention discloses a preparation method of a metal friction layer transmission electron microscope sample. The method includes: cutting a metal sheet from a sample and grinding to obtain a polished metal sheet; embedding the polished metal sheet in a metal tube, and sticking the inlaid place with resin to obtain a sheet sample; Grind the opposite sides respectively to obtain the polished thin sample, and carry out ion thinning treatment until the hole of the thin sample emerges to obtain the ion thinned sample; perform ion polishing treatment on the ion thinned sample to obtain the The metal friction layer transmission electron microscope sample. The preparation method of the invention is simple in process, uses mature sample preparation equipment and technology, is beneficial to prevent the friction layer from falling off in the process of sandpaper grinding and the sample fragmentation that easily occurs in the process of thinning by using a pit meter, and is suitable for micron-level surfaces. Preparation of cross-sectional transmission electron microscopy samples of metal friction layers with multilayer structures such as oxide layers and severely plastically deformed layers. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114088751-A |
| priorityDate |
2021-05-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |