http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113380696-A

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filingDate 2021-04-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_70db7ad493e3ce66af07716d30ce8492
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publicationDate 2021-09-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-113380696-A
titleOfInvention Deep groove filling method and deep groove filling structure
abstract The invention relates to a deep groove filling method and a deep groove filling structure. The above-mentioned deep trench filling method includes the following steps: providing a semiconductor substrate with at least one deep trench, and the aspect ratio of the deep trench is less than or equal to 40; placing an insulating member on the semiconductor substrate, and the insulating member shields the opening of the deep trench , the material of the insulating part is a polymer material; the insulating part is heated to make the insulating part in a liquid state; under vacuum conditions, the insulating part is pressurized to fill the liquid insulating part in the deep groove, and then cured, and the deep groove is cured. An insulating layer is formed inside. The above-mentioned deep trench filling method only takes several minutes to ten minutes to fill the insulating layer in the deep trench, which greatly saves the deposition time and improves the production efficiency compared with the traditional chemical vapor deposition method (requires dozens of hours). In addition, the material of the insulating material using polymer material as the insulating layer has little difference in dielectric constant compared with the traditional silicon dioxide as the insulating layer, and is even partially higher than that of silicon dioxide, with good insulation.
priorityDate 2021-04-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 23.